Image:Diode.jpg

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(Diode test circuit model.)
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Diode test circuit model.
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Diode test circuit model from Convex Optimization & Euclidean Distance Geometry, Chapter 8.1.
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'''('''a''')''' Large signal diode model:
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1''')''' junction capacitance C_j is small enough to ignore for audio applications,
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2''')''' diffusion capacitance C_d whose polarization (+) indicates significant capacitance only for positive bias voltage v_d , 
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3''')''' static semiconductor & contact resistivity R_d a.k.a parasitic resistivity.
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'''('''b''')''' Figure 211b unbalancing and consolidation to help explain high median impedance of diffusion capacitor.
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[[https://www.convexoptimization.com/TOOLS/Sedra.pdf PSPICE DEVICE MODELS & SIMULATION, App.B.1.2]]

Current revision

Diode test circuit model from Convex Optimization & Euclidean Distance Geometry, Chapter 8.1. (a) Large signal diode model: 1) junction capacitance C_j is small enough to ignore for audio applications, 2) diffusion capacitance C_d whose polarization (+) indicates significant capacitance only for positive bias voltage v_d ,  3) static semiconductor & contact resistivity R_d a.k.a parasitic resistivity. (b) Figure 211b unbalancing and consolidation to help explain high median impedance of diffusion capacitor. [PSPICE DEVICE MODELS & SIMULATION, App.B.1.2]

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